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Part B: OLED simulation using ray tracing

1. Introduction

In the previous section we used the transfer matrix method (TMM) to compute the probability that photons escape the device. TMM treats light as a wave, naturally capturing multiple reflections at layer interfaces and the resulting interference within the thin-film cavity.

In this section we switch to a complementary approach: ray tracing. Here light is treated as particles (rays), which is the paradigm widely used in computer graphics. A key advantage is its explicit angular dependence: we can track how rays refract and reflect as they leave the device and therefore predict angle-resolved behavior—such as the colour (spectrum) observed as a function of viewing angle—which is the focus of this section.

2. Quick start - ray tracing

To create a new OLED ray-tracing simulation, open the New simulation window and double-click OLED (Ray Trace) (see ??). Save the new project to disk. After it opens, you’ll see the main OLED interface ( ?? ), which is similar to the previous example, but with the ray tracer enabled as the optical model.

New simulation window showing the option to create an OLED (Ray Trace) project.
The New simulation window showing the option to create an OLED (Ray Trace) project.
Default OLED simulation window with ray tracing enabled.
The default OLED simulation window that opens with ray tracing enabled.

In the main interface, navigate to the Optical ribbon (??) and click on Optical outcoupling, just as in the previous simulation. This opens the outcoupling window (see ??). Notice that this time the Ray Trace button is selected in the main interface instead of the Transfer Matrix button. Clicking the Run optical simulation (▶) button will launch the ray tracer, which propagates rays from every mesh point within the active layer to calculate the probability that photons escape the device at each position.

OghmaNano Optical ribbon showing tools for light-source setup, transfer matrix calculations, optical outcoupling, ray-tracing editor, FDTD simulation, mode calculator, optical thickness, optical mesh, and boundary conditions.
The Optical ribbon in OghmaNano. This toolbar groups all optical modelling tools, click on Optical outcoupling to launch the light-extraction analysis tool.
Outcoupling calculated using the ray tracing method.
Outcoupling efficiency calculated using the ray tracing method.

This will take much longer than TMM simulations due to the increased complexity. Also the simulations will only calculate the escape probability for the active area to save time. Note that the outcoupling efficiency for ray tracing is lower than that predicted by the transfer matrix as the transfer matrix method assumes propagation normal to the interfaces while ray tracing allows rays to travel in all directions some of which will never leave the device.

3. Electrical simulations combined with ray tracing

Now return to the main simulation window and press the blue Play button (or press 9) to run the main simulation. This run first executes the ray tracer and then the drift–diffusion solver. The ray tracer calculates the probability that photons generated in the active layer escape the device, and it also determines the emission angle distribution (hence which colours are visible at which angles). The drift–diffusion solver then computes the magnitude of the emitted light by evaluating the recombination term, which represents the radiative emission rate. The resulting ray-tracing view is shown in Figure 5, and the corresponding voltage–light output plot (lv.csv, light vs. voltage) is shown in Figure 6.

OghmaNano Optical ribbon with Ray tracing selected: a 3D OLED stack is shown with multicolored rays launched from the emissive layer and refracting or trapping at interfaces after a drift–diffusion run.
OghmaNano main window after a combined simulation: the drift–diffusion solver supplies the spatial recombination profile (emissive source), and the Optical → Ray tracing engine propagates rays through the multilayer OLED, capturing extraction, total internal reflection, and waveguiding losses.
Graph titled 'Voltage – Light flux': light output remains near zero below turn-on then rises sharply with increasing applied voltage.
Voltage–light output curve from the combined electro–optical workflow. Below turn-on the emitted flux is negligible; once carrier injection and radiative recombination increase, the outcoupled optical power rises steeply with voltage.

3. Key outputs

If you inspect the outputs of the combined ray-tracing and drift–diffusion simulation (??), you’ll see that many files match those described in the previous (transfer-matrix) section. The crucial addition is that ray tracing yields an angle-resolved emission profile, so OghmaNano also writes angle-dependent color data: the overall RGB versus viewing angle (theta_RGB.csv) and the CIE 1931 components x, y, z and tristimulus X, Y, Z versus angle (theta_x/y/z.csv, theta_X/Y/Z.csv). These appear as rainbow spectrum preview icons in the figure and are summarized in the table below.

Main OghmaNano window showing output files from a combined drift–diffusion + ray-tracing run, including angle-resolved RGB and CIE (x,y,z / X,Y/Z) data.
Outputs from the combined drift–diffusion and ray-tracing simulation. Compared with the earlier transfer-matrix workflow, ray tracing produces more files because it resolves the viewing-angle dependence of color and intensity (theta_RGB.csv, theta_x/y/z.csv, theta_X/Y/Z.csv, etc.).
CIE 1931 x component versus viewing angle from theta_x.csv.
CIE 1931 x vs. angle
CIE 1931 y component versus viewing angle from theta_y.csv.
CIE 1931 y vs. angle
CIE 1931 z component versus viewing angle from theta_z.csv.
CIE 1931 z vs. angle
Angle-resolved RGB color map derived from theta_RGB.csv.
RGB color vs. angle
Files describing the change of color with viewing angle.
File name Description
theta_RGB.csv RGB values vs. viewing angle
theta_x.csv CIE 1931 x vs. viewing angle
theta_y.csv CIE 1931 y vs. viewing angle
theta_z.csv CIE 1931 z vs. viewing angle
theta_X.csv CIE 1931 X vs. viewing angle
theta_Y.csv CIE 1931 Y vs. viewing angle
theta_Z.csv CIE 1931 Z vs. viewing angle

4. The spectrum of the emitted light

Just as you set electrical parameters per layer, you can configure the emission spectrum for each layer in the Emission parameters window (open it from Device structure → Emission parameters in the main interface; see Figure 5). The spectrum can be either:

When Ray tracing is used for outcoupling, each layer can specify emission directions under the Ray tracing section using spherical angles: Theta steps (e.g. 180), Theta start/stop (degrees, e.g. 0–360); Phi steps (e.g. 25), Phi start/stop (degrees, e.g. 0–360). This lets you explore angular light escape. For flat, laterally uniform stacks, symmetry often means you only need to vary one of theta or phi.

The Emit from option controls ray source positions: Center of each layer launches rays from the middle of each emission layer (fast); At each electrical mesh point launches rays at every electrical node for higher fidelity (slower, but can be offset by increasing the number of threads).

Emission parameters window with 'Use experimental emission spectra' On. Fields: Experimental emission spectra (file chooser), Experimental emission efficiency (0.0–1.0), Ray tracing angles (Theta steps/start/stop, Phi steps/start/stop, degrees), and Emit from selector.
(a) Using an experimental emission spectrum: toggle On, select a dataset (e.g. small_molecules/Alq3), set efficiency, and configure angular sampling for ray tracing.
Emission parameters window with 'Use experimental emission spectra' Off. Additional fields appear for photon-generation efficiencies: nfree→pfree, nfree→ntrap, ntrap→pfree, ptrap→nfree, pfree→ptrap (each 0.0–1.0). Ray tracing theta/phi ranges and steps plus Emit from are also shown.
(b) Using a calculated spectrum: toggle Off to enable Fermi’s-Golden-Rule mode with per-channel photon-generation efficiencies, alongside the same ray-tracing angle and source-placement controls.